PEAXIS: A RIXS and XPS Endstation for Solid-State Quantum and Energy Materials at BESSY II




PEAXIS (Photo Electron Analysis and resonant X-ray Inelastic Spectroscopy) is a dedicated endstation installed at the beamline U41-PEAXIS that offers high resolution soft X-ray spectroscopy measurements with incident photon energies ranging from 180 – 1600 eV. The endstation combines two X-ray spectroscopic techniques, X-ray photoelectron spectroscopy (XPS) and resonant inelastic soft X-ray scattering (RIXS), which are important for probing the electronic structure and local and collective excitations of solid-state materials. It features a continuous variation of scattering angle under UHV conditions for wave vector-resolved studies and a modular sample environment that allows investigation in the temperature range between 10 K and 1000 K.


Schulz, C., Lieutenant, K., Xiao, J., Hofmann, T., Wong, D. and Habicht, K. (2020) Characterization of the soft X-ray spectrometer PEAXIS at BESSY II, J. Synchrotron Rad.

Lieutenant, K., Hofmann, T., Zendler, C., Schulz, C., Aziz, E. F. and Habicht, K. (2016), Numerical optimization of a RIXS spectrometer using raytracing simulations, Journal of Physics: Conference Series.

Lieutenant, K., Hofmann, T., Schulz, C., Yablonskikh, M., Habicht, K. and Aziz, E. F. (2016) Design Concept of the High-Resolution End-station PEAXIS at BESSY II: Wide-Q-Range RIXS and XPS Measurements on Solids, Solutions, and Interfaces. J. El. Spec. Rel. Phen.